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IEC/AWI TS 63757 - Single fault conditions of magnetic resonance equipment and other considerations for magnetic resonance conditional implant assessments

Дата публикации: 03-08-2026 00:00:00


This document reached stage 20.00 on 2026-08-03, TC/SC: ISO/TC 150/SC 6

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Классификация: Наука. Схожих патентов: 0. Схожих новостей: 10. Тональность: 0. Информативность: 17.8. Источник: www.iso.org.