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Test Method for Total Ionizing Dose (TID) from X-ray Exposure in Terrestrial Applications

Дата публикации: 27-11-2023 21:14:33

JESD22-B121A2026-08-14 00:00:00This test method defines the requirements to measure parasitic radiation dose to determine consequential damage or effects to semiconductor devices and associated Total Ionizing Dose (TID) failure limit due to X-ray exposure in terrestrial applications.
Committees: JC-14JC-14.1

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